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Electromagnet variable temperature variable field Hall test system HSEM series

Electromagnet variable temperature variable field Hall test system HSEM series

HSEM series electromagnet Hall effect test system is composed of electromagnet, Hall tester, controller, sample temperature variable option and so on。There is a continuously variable magnetic field environment, optional ±0.8T或±1.5T two configurations, with a rich temperature options, including: room temperature, liquid nitrogen single point, 10K-400K closed cycle low temperature options, room temperature -1273K high temperature options。

Electromagnet variable temperature variable field Hall test system HSEM series product overview

HSEM series electromagnet Hall effect test system is composed of electromagnet, Hall tester, controller, sample temperature variable option and so on。±1 can be achieved depending on the selected configuration.5T magnetic field, 10K sample temperature, 1273K sample temperature and other properties。It has the characteristics of large magnetic field range and wide temperature zone。It can satisfy customers to measure the resistivity, carrier concentration, carrier type, Hall coefficient, electron mobility and other parameters of the material under different temperatures or different magnetic fields。


System features:
• Has continuously variable magnetic field environment, optional ±0.8T或±1.5T Two configurations
• Rich temperature options, including: room temperature, liquid nitrogen single point, 10K-400K closed cycle low temperature options, room temperature -1273K high temperature options
• Mobility range: 0.01-10^6
• Measured sample resistance range: 10 m Ω Ω - 100 g
• Carrier concentration: 8 × 102 to 8 × 1023 cm-3
• Room temperature shielding box provides room temperature test environment for samples, and provides a variety of room temperature sample cards to meet the Hall test of samples of various specifications。
• Can quickly switch between the low temperature thermostat and the room temperature shielding box through the slide rail, which can quickly change the sample or the sample environment, improve the sample change efficiency。

Test materials:
• Thermoelectric materials: bismuth telluride, lead telluride, silicon germanium alloy, etc
• Photovoltaic materials/solar cells: (A silicon (monocrystalline silicon, amorphous silicon) CIGS (copper indium gallium selenium), cadmium telluride, perovskite, etc.)
• Organic materials: (OFET, OLED)
• Transparent conductive metal oxide TCO: (ITO, AZO, ZnOIGZO (Indium gallium zinc oxide), etc.)
• Semiconductor materials: SiGe, InAs, SiC, InGaAs, GaN, SiC, InP, ZnO, Ga2O3, etc
• 2D materials: graphene, BN, MoS2


Electromagnet variable temperature variable field Hall test system HSEM series technical parameters

Parameters and indicators:

型号
HSEM-08
HSEM-15
Magnetic field size
±0.8T
±1.5T
mobility
1*10-2 to 1*106 cm2 / Vs
Carrier concentration
8x102-8x1023/cm3
Sample resistance range
10 m Ω Ω - 100 g
Voltage excitation range
100nV ~ 10V
Current excitation range
10pA ~ 100mA
Test method
Vanderbilt or Holba
Sample size

Standard 10mm*10mm

Customizable Φ50mm or other sizes

Support temperature options

Liquid nitrogen option

Closed loop low temperature option

High temperature furnace


Electromagnet variable temperature variable field Hall test system HSEM series of applications

semiconductor
Integrated circuit
wafer

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